Measurement of Surface Photovoltage In High-rate Deposited A-si-h Films and Comparison With Photothermal Deflection Spectroscopy and Conductivity Data (bibtex)
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Reference:
"Measurement of Surface Photovoltage In High-rate Deposited A-si-h Films and Comparison With Photothermal Deflection Spectroscopy and Conductivity Data" R. Schwarz, S. Goedecker, T. Muschik, N. Wyrsch, A. V. Shah, H. Curtins Journal of Non-crystalline Solids 97-8, 759–762 (1987).doi:10.1016/0022-3093(87)90179-7 [bibtex]
Bibtex Entry:
@Article{Schwarz1987,
  Title                    = {{M}easurement of {S}urface {P}hotovoltage {I}n {H}igh-rate {D}eposited {A}-si-h {F}ilms and {C}omparison {W}ith {P}hotothermal {D}eflection {S}pectroscopy and {C}onductivity {D}ata},
  Author                   = {{S}chwarz, {R}. and {G}oedecker, {S}. and {M}uschik, {T}. and {W}yrsch, {N}. and {S}hah, {A}. {V}. and {C}urtins, {H}.},
  Journal                  = {Journal of Non-crystalline Solids},
  Year                     = {1987},

  Month                    = dec,
  Pages                    = {759--762},
  Volume                   = {97-8},

  Doi                      = {10.1016/0022-3093(87)90179-7}
}
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